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Application fields
Semiconductor Research
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Characterization of dopant distributions
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Analysis of thin film solar cells
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Investigation of nanoelectronic devices
Materials Science
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Study of conductive polymers and composites
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Examination of corrosion processes
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Analysis of battery electrode materials
Nanotechnology
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Characterization of carbon nanotubes and graphene
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Development of nanoscale sensors and actuator
Conductive Atomic Force Microscopy (C-AFM)
Unveiling Nanoscale Electrical Properties
Conductive Atomic Force Microscopy (C-AFM) is an advanced AFM technique that allows for simultaneous measurement of sample topography and electrical properties at the nanoscale. This powerful mode is crucial for characterizing a wide range of materials, from semiconductors to biological samples, offering unprecedented insights into local conductivity variations.
Energy Research
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Optimization of photovoltaic materials
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Investigation of fuel cell components
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Study of energy storage materials
Biology and Medicine
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Analysis of conductive biomaterials
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Investigation of cellular electrical properties
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Development of biosensors
Key Features
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Wide Current Range: Measure currents from pA to µA
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High Spatial Resolution: Achieve lateral resolution down to a few nanometers
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Simultaneous Topography: Correlate electrical properties with surface features
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Spectroscopy Capabilities: Perform local I-V curve measurements
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Integration with Other Modes: Combine C-AFM with mechanical or thermal property mapping
Our advanced C-AFM implementation offers:
ITO, 3µm scan Current signal C-AFM
Battery analysis with standard C-AFM
Battery analysis with advanced CSInstruments techniques
Benefits of Conductive AFM
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Superior Sensitivity: Our advanced C-AFM implementation offers unparalleled current detection capabilities.
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User-Friendly Interface: Intuitive software makes C-AFM accessible to both experts and beginners.
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Versatility: Easily combine C-AFM with other AFM modes for comprehensive sample characterization.
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Expert Support: Our team of specialists provides ongoing support and training.
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Cutting-Edge Research: Stay at the forefront of nanoscale electrical characterization with our continuously updated technology.