.png)
Application fields
-
Organic Solar Cells
-
Conducting Polymers
-
Biological Samples
-
Thin Films
-
Nanocomposites
-
2D Materials
Contact Mode
Fundamental Imaging for Nanoscale Discovery
Contact Mode is one of the foundational techniques in Atomic Force Microscopy (AFM), offering high-resolution imaging and force measurement capabilities. In this mode, a nanometric probe maintains constant contact with the sample surface, providing direct topographical information and friction data.
Key Features
-
High Resolution: Achieve atomic-scale imaging on suitable samples.
-
Direct Force Measurement: Quantitative analysis of tip-sample interactions.
-
Versatility: Compatible with various sample types and environments.
-
Simultaneous Data Acquisition: Collect topography and friction data in a single scan.
-
Established Technique: Well-understood methodology with extensive literature support.
Fibers in polymer matrix,
Scan size 30µm x 30 µm
RAM,
Scan size 50µm x 50 µm
Polished alloy
Scan size 30 µm x 30 µm
Block Polymer,
Scan size 25µm x 25 µm
Benefits of Contact Mode AFM
Force Curves
Perform precise force-distance measurements to study:
-
Adhesion forces
-
Material elasticity
-
Surface energy
Friction Analysis
Utilize Lateral Force Microscopy (LFM) to investigate:
-
Nanoscale tribology
-
Surface lubrication
-
Material homogeneity
Environmental Control
Conduct experiments in various conditions:
-
Controlled atmosphere
-
Liquid environments
-
Temperature variations
