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Application fields
Materials Science
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Characterization of dielectric thin films
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Study of charge distribution in composite materials
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Investigation of ferroelectric domain structures
Electronic Materials
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Failure analysis in microelectronic devices
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Detection and mapping of trapped charges
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Characterization of semiconductor dopant distributions
Life Sciences
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Study of charge distributions in biological membranes
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Investigation of electrical properties of biomaterials
Electric Force Microscopy (EFM)
Unveiling Nanoscale Electric Field Distributions
Electric Force Microscopy (EFM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of electric field gradients at the nanoscale. This powerful mode is crucial for studying a wide range of materials and devices, offering unprecedented insights into their electrical properties and behavior.
Polymer Science
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Analysis of charge accumulation and dissipation in polymers
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Characterization of piezoelectric polymers
Nanotechnology
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Electrical characterization of nanomaterials (e.g., carbon nanotubes, graphene)
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Development and optimization of nanoelectronic devices
Key Features
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High Sensitivity: Detect even the smallest variations in electric field gradients
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Excellent Spatial Resolution: Achieve lateral resolution down to a few nanometers
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Non-Destructive Imaging: Ideal for delicate or sensitive samples
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Quantitative Measurements: Map relative strengths of electric fields across surfaces
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Integration with Other Modes: Combine EFM with topography, mechanical, or other electrical modes for comprehensive analysis
Benefits of EFM Mode
2 Nanotubes network deposited between 2 electrodes, EFM mode, 65µm scan
Graphene Scan Result with EFM 10 µm scan
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Superior Resolution: Our advanced EFM implementation offers unparalleled spatial resolution and sensitivity.
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User-Friendly Interface: Intuitive software makes EFM accessible to both experts and beginners.
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Versatility: Easily combine EFM with other AFM modes for comprehensive sample characterization.
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Expert Support: Our team of specialists provides ongoing support and training.
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Cutting-Edge Research: Stay at the forefront of nanoscale electrical characterization with our continuously updated technology.
