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Application fields
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Organic Solar Cells
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Conducting Polymers
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Biological Samples
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Thin Films
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Nanocomposites
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2D Materials
Force Modulation Mode (FMM)
Mapping Nanoscale Mechanical Properties
Force Modulation Mode (FMM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of mechanical properties at the nanoscale. This powerful mode is crucial for studying materials with nonuniform mechanical characteristics, making it especially valuable in materials science and polymer research.
Key Features
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High Sensitivity: Detect subtle variations in mechanical properties across sample surfaces
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Excellent Spatial Resolution: Achieve lateral resolution down to nanometer scale
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Quantitative Measurements: Map relative differences in elastic modulus and viscoelasticity
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Wide Dynamic Range: Suitable for a broad spectrum of materials, from soft polymers to rigid composites
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Integration with Other Modes: Combine FMM with electrical or thermal property mapping for comprehensive analysis
Black Polymer,
Scan size 50µm x 50 µm
Carbon Fibers in Epoxy,
Scan size 30 µm x 30 µm
Benefits of Force Modulation Mode
Superior Resolution:
Our advanced FMM implementation offers unparalleled spatial resolution and sensitivity.
User-Friendly Interface:
Intuitive software makes FMM accessible to both experts and beginners.
Versatility:
Easily combine FMM with other AFM modes for comprehensive sample characterization.
Expert Support:
Our team of specialists provides ongoing support and training.
Cutting-Edge Research:
Stay at the forefront of nanomechanical characterization with our continuously updated technology.
