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Nano Observer II Advanced AFM

Specifications:

  • Temperature Range: -40°C to 300°C

  • Temperature Stability: ±0.1°C

  • Heating/Cooling Rate: Up to 10°C/min (sample dependent)

  • Sample Size: Compatible with standard AFM sample holders

  • AFM Mode Compatibility: All modes (Contact, Oscillating, Electrical, etc.)

EZ Temperature: Precision Thermal Control for AFM
Advanced Temperature-Controlled AFM Measurements

The EZ Temperature accessory, developed by CSInstruments for the Nano-Observer AFM, delivers precise temperature control and stable imaging during temperature changes. This powerful addition to your AFM setup opens new possibilities for studying temperature-dependent phenomena at the nanoscale.

Key Features

  • Wide Temperature Range: From -40°C to 300°C

  • Compatibility: Works with all AFM modes

  • Minimal Thermal Drift: Optimized design reduces temperature gradients

  • Stable Imaging: Maintain high-quality scans during temperature changes

  • Versatile Applications: Ideal for polymers, materials science, and biological samples

  • Seamless Integration: Designed specifically for the Nano-Observer AFM

Temperature : 70°C to 40°C

Resonant mode

PCL (polycaprolactone) crystallization under controlled temperature

Scan size : 20µm

Real time aquisition, Polymer cystallization 10 µm 

temperature dependent afm results

Benefits of EZ Temperature Module

  1. Limited Thermal Expansion: Minimized drift for stable imaging

  2. Low Temperature Capability: Expand your research with different temperature conditions

  3. Thermal Insulation: Protect sensitive AFM components

  4. Precise Temperature Control: Achieve accurate and reproducible thermal conditions

  5. Real-Time Imaging: Observe dynamic processes during temperature changes

  6. Versatile Compatibility: Works with various modes and environmental controls

Nano Observer II Advanced AFM

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