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Nano Observer II Advanced AFM

Application fields

Data Storage

  • Characterization of magnetic recording media

  • Analysis of bit patterns in hard drives

  • Development of next-generation magnetic storage technologies

Semiconductor Industry

  • Inspection of magnetic sensors and MEMS devices

  • Failure analysis in magnetic components

Materials Science

  • Study of magnetic domain structures in various materials

  • Investigation of magnetic thin films and multilayers

  • Characterization of novel magnetic nanomaterials

Magnetic Force Microscopy (MFM) Mode
Unveiling Nanoscale Magnetic Structures

Magnetic Force Microscopy (MFM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of magnetic force gradients at the nanoscale. This powerful mode is crucial for studying magnetic materials, data storage devices, and a wide range of magnetic phenomena.

Spintronics

  • Research on spin-dependent transport phenomena

  • Development of spintronic devices

Geoscience

  • Analysis of magnetic properties in geological samples

  • Study of magnetic inclusions in minerals

Key Features

  • High Sensitivity: Detect even the weakest magnetic domains and structures

  • Excellent Spatial Resolution: Achieve lateral resolution down to 20 nm

  • Non-Destructive Imaging: Ideal for studying sensitive magnetic samples

  • Quantitative Measurements: Map relative strengths of magnetic fields across surfaces

  • Integration with Other Modes: Combine MFM with electrical or mechanical property mapping

Cobalt Alloy Coating topography and MFM results,  Scan size 30µm x 30 µm

Cobalt Alloy Coating topography and MFM results,

Scan size 30µm x 30 µm

Cobalt Alloy Coating topography and MFM results,  Scan size 30µm x 30 µm

Magnetical Pattern, Topography and MFM results

Scan size 24 µm x 24 µm

Stainless Steel, MFM Mode  Scan size 18 µm x 18 µm​

Stainless Steel, MFM Mode

Scan size 18 µm x 18 µm

Benefits of MFM Mode

  • Superior Resolution: Our advanced MFM implementation offers unparalleled spatial resolution and sensitivity.

  • User-Friendly Interface: Intuitive software makes MFM accessible to both experts and beginners.

  • Versatility: Easily combine MFM with other AFM modes for comprehensive sample characterization.

  • Expert Support: Our team of specialists provides ongoing support and training.

  • Cutting-Edge Research: Stay at the forefront of magnetic nanoscale characterization with our continuously updated technology.

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