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Nano Observer II Advanced AFM

Application fields

Materials Science

  • Characterization of dielectric thin films

  • Study of charge distribution in composite materials

  • Investigation of ferroelectric domain structures

Electronic Materials

  • Failure analysis in microelectronic devices

  • Detection and mapping of trapped charges

  • Characterization of semiconductor dopant distributions

Life Sciences

  • Study of charge distributions in biological membranes

  • Investigation of electrical properties of biomaterials

Oscillating Mode
Gentle, High-Resolution Imaging for Diverse Samples

Oscillating Mode AFM, also known as Tapping Mode or Dynamic Mode, is a versatile and widely used Atomic Force Microscopy technique. This mode offers high-resolution imaging with minimal sample interaction, making it ideal for a broad range of materials, from soft biological samples to hard semiconductor surfaces.

Polymer Science

  • Analysis of charge accumulation and dissipation in polymers

  • Characterization of piezoelectric polymers

Nanotechnology

  • Electrical characterization of nanomaterials (e.g., carbon nanotubes, graphene)

  • Development and optimization of nanoelectronic devices

Key Features

Spherulites,

Scan size 20µm x 20 µm

Proteins,

Scan size 2 µm x 2 µm

  • High-Sensitivity Phase Contrast: Detect subtle variations in material properties.

  • Wide Bandwidth Frequency: Accommodate various cantilever types and sample requirements.

  • Integrated Lock-in Amplifier: Ensure precise amplitude and phase measurements.

  • Low Contact Forces: Minimize sample damage and tip wear.

  • Versatile Imaging: Suitable for both soft and hard samples.

Spherulites on Tapping Mode Scan size 20µm x 20 µm
Proteins on tapping mode afm Scan size 2 µm x 2 µm
Hexagonal structures on tapping mode afm Scan size 3 µm x 3 µm​
Collagens on tapping mode afm Scan size 5µm x 5 µm

Hexagonal structure

Scan size 3 µm x 3 µm​

Collagens,

Scan size 5µm x 5 µm

Benefits of Oscillating Mode AFM

  1. Superior Resolution: Our advanced implementation offers high spatial resolution and sensitivity.

  2. User-Friendly Interface: Intuitive software makes Oscillating Mode AFM accessible to both experts and beginners.

  3. Versatility: Easily switch between Oscillating Mode and other AFM modes for comprehensive sample characterization.

  4. Expert Support: Our team of specialists provides ongoing support and training.

  5. Cutting-Edge Research: Stay at the forefront of nanoscale characterization with our continuously updated technology.

Nano Observer II Advanced AFM

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