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Application fields
Materials Science
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Characterization of ferroelectric thin films
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Study of domain structures in piezoelectric ceramics
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Investigation of electromechanical properties in composite material
Nanotechnology
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Development and optimization of nanoscale actuators and sensors
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Exploration of 2D piezoelectric materials
Energy Research
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Analysis of piezoelectric energy harvesters
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Study of ferroelectric solar cells
Biology
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Examination of piezoelectric properties in biological materials (e.g., bone, collagen)
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Investigation of electromechanical coupling in cell membranes
Data Storage
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Research on ferroelectric memory devices
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Domain writing and reading for potential data storage applications
Piezoresponse Force Microscopy (PFM)
Unveiling Nanoscale Electromechanical Properties
Piezoresponse Force Microscopy (PFM) is an Atomic Force Microscopy (AFM) technique that allows for the visualization and manipulation of electromechanical coupling at the nanoscale. This powerful mode is crucial for studying piezoelectric and ferroelectric materials, offering unprecedented insights into their structure, properties, and behavior.
Key Features
Our advanced PFM implementation offers:
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High Sensitivity: Detect even the smallest piezoelectric responses
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Dual-Frequency Mode: Simultaneously map topography and piezoresponse
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Vector PFM: Measure both vertical and lateral piezoresponse components
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Spectroscopy Capabilities: Perform local hysteresis measurements
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Integration with Other Modes: Combine PFM with conductivity or mechanical property mapping
Benefits of Contact Mode AFM
Superior Resolution
Our advanced PFM implementation offers unparalleled spatial resolution.
User-Friendly Interface
Intuitive software makes PFM accessible to both experts and beginners.
Versatility
Easily combine PFM with other AFM modes for comprehensive sample characterization.
Expert Support
Our team of specialists provides ongoing support and training.
Cutting-Edge Research
Stay at the forefront of piezoelectric and ferroelectric research with our continuously updated technology.
Piezoresponse Force Microscopy mode (PFM) PZT sample, Topography & phase signal, Scan size :10µm
Topography
PFM Mode
Phase Signal