ResiScope™ III is an advanced module for Atomic Force Microscopy (AFM) that enables high-precision electrical measurements at the nanoscale. Here's an overview of its working principle:

​

1. Conductive Probe:

   • A conductive AFM tip is used to scan the sample surface.

   • The tip acts as one electrode, while the sample acts as the other.

2. Voltage Application:

   • A DC bias voltage is applied between the tip and the sample.

3. Current Measurement:

   • As the tip scans across the surface, it measures the current flowing between the tip and the sample.

   • The current range can be from 100 fA to 1 mA.

4. Resistance Calculation:

   • Using the applied voltage and measured current, the system calculates the local resistance.

   • The resistance range covered is from 10² to 10¹² ohms.

5. Fast Auto-Ranging:

   • A fast processor-driven auto-ranging system allows for real-time adjustment of the measurement range.

   • This enables accurate measurements across a wide range of conductivities without manual intervention.

6. Current Control:

   • The system includes real-time current control to prevent sample damage and ensure measurement accuracy.

7. Simultaneous Topography:

   • While measuring electrical properties, the system simultaneously captures topography data.

   • This allows for correlation between physical structure and electrical characteristics.

8. Multiple AFM Modes:

   • ResiScope III is compatible with various AFM modes, including contact, oscillating, and spectroscopy modes.

   • It can be combined with other techniques like HD-KFM for comprehensive sample analysis.

9. Data Processing and Visualization:

   • The collected data is processed in real-time to create high-resolution maps of current and resistance.

   • These maps can be overlaid with topography data for integrated analysis.

10. Environmental Flexibility:

    • Measurements can be performed in air, controlled atmospheres, or even in liquid environments, depending on the sample requirements.

​

The unique design of ResiScope III allows for unprecedented sensitivity and range in electrical measurements, making it a powerful tool for nanoscale electrical characterization across a wide range of materials and applications.

ResiScope III vs. C-AFM

​

• Wider Measurement Range: ResiScope III offers an unprecedented range of electrical measurements in a single module, eliminating the need for multiple instruments or frequent sample changes.

• Enhanced Sensitivity: High sensitivity across the entire measurement range allows for accurate characterization of a wide variety of materials, from highly conductive to near-insulating.

• Versatility: Compatibility with various AFM modes and other techniques makes ResiScope III a more versatile tool for comprehensive sample analysis.

• Speed and Efficiency: Fast auto-ranging and simultaneous data acquisition significantly reduce experiment time and increase productivity.

• Sample Preservation: Real-time current control minimizes the risk of sample damage, crucial for delicate or valuable specimens.

• Comprehensive Data: The ability to simultaneously map topography and electrical properties provides more insightful and correlative data.

• Adaptability: Functionality in various environments expands the range of possible experiments and sample types.

​

While traditional C-AFM remains a useful technique, ResiScope III represents a significant advancement in nanoscale electrical characterization, offering greater range, precision, and versatility for cutting-edge research and analysis.