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Application fields

  • Organic Solar Cells

  • Conducting Polymers

  • Biological Samples

  • Thin Films

  • Nanocomposites

  • 2D Materials

Soft IC Mode 
The 3rd AFM mode
Gentle Precision for Delicate Samples

Revolutionize your nanoscale imaging with CSInstruments' Soft Intermittent Contact Mode. Combining the benefits of contact and tapping modes, this innovative technique offers unparalleled resolution for soft, fragile, and loosely bound samples. Experience quantitative measurements without compromising sample integrity.

Key Features

Non-Destructive Measurements:

Ideal for fragile and soft conductive samples

Wide Measurement Range:

Resistance from 10² to 10¹² ohms

No Friction:

Prevents sample damage and tip wear

Constant Force:

Ensures quantitative electrical measurements

Intermittent Contact:

Optimizes electrical measurement while preserving tip and sample integrity

P3HT (Organic PV cell)  3 μm scan

P3HT (Organic PV cell)

3 μm scan

VO² sample, 10µm, Topography and resistance signals

Quantitative Measurements

Resistance signal, 5μm scan, Soft ResiScope mode

Ultrathin granular gold layer evaporated on a doped-Si substrate

Resistance signal,

5μm scan

Soft ResiScope provides quantitative measurements comparable to standard ResiScope in contact mode:

  • Identical Results: Topography and resistance signals match between Soft ResiScope and contact mode ResiScope on standard electrical samples (e.g., SRAM)

  • High Resolution: Maintains lateral resolution while ensuring quantitative measurements

Advantages Over Traditional Methods

Soft ResiScope vs. Oscillating/Contact Modes

Soft ResiScope vs ResiScope
Section comparison

Soft ResiScope vs. Oscillating/Contact Modes

  • Sample Preservation: Prevents surface damage common in contact mode

  • Equivalent Results: Produces data comparable to oscillating mode on fragile samples

  • Versatility: Suitable for a wide range of materials, from polymers to biological samples

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