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Nano Observer II Advanced AFM

Application fields

Data Storage Technology

  • Study magnetic recording media under varying field conditions

  • Investigate domain wall motion in next-generation storage devices

  • Optimize magnetic bit patterns for increased data density

Materials Science

  • Characterize novel magnetic materials and nanostructures

  • Analyze magnetization reversal processes in thin films

  • Study magnetic phase transitions and domain dynamics

Variable Magnetic Field Module (VMFM)
Advanced Magnetic Characterization at the Nanoscale

The Variable Magnetic Field Module (VMFM) represents the pinnacle of magnetic characterization in Atomic Force Microscopy (AFM). By combining high-resolution Magnetic Force Microscopy (MFM) with an innovative in-plane magnetic field generator, VMFM enables dynamic studies of magnetic phenomena at the nanoscale, opening new frontiers in materials science and data storage research.

Semiconductor Industry

  • Evaluate magnetic properties of spintronic devices

  • Investigate magnetic sensors and MEMS devices

  • Perform failure analysis on magnetic components

Fundamental Physics

  • Explore magnetization dynamics at the nanoscale

  • Study topological magnetic structures like skyrmions

  • Investigate magnetoelectric coupling in multiferroic materials

Key Features

  • Dynamic Magnetic Imaging: Observe real-time changes in magnetic domains

  • In-Plane Magnetic Field: Generate controlled magnetic fields up to 3000 Gauss

  • No Sample Heating: Unique design eliminates current-induced heating

  • High Resolution: Maintain nanoscale imaging capabilities during field application

  • In-Situ Control: Adjust magnetic field strength and direction during experiments

  • Seamless Integration: Designed for compatibility with Nano-Observer AFM systems

Sample : Magnetic triangles structures 

Scan size : 6µm

Mode : MFM

Environment : VMFM

Magnetic Field Generator

Benefits of Contact Mode AFM

  1. Advanced Magnetic Studies: Perform dynamic magnetic characterization impossible with standard MFM

  2. Non-Invasive Analysis: No current-induced sample heating, preserving sensitive samples

  3. High Resolution: Maintain nanoscale imaging capabilities under applied magnetic fields

  4. Versatile Applications: Adapt to a wide range of magnetic materials and research questions

  5. User-Friendly Operation: Intuitive control of magnetic field parameters during experiments

Nano Observer II Advanced AFM

Check the
Nano-Observer II page for more details about the modes

magnetic force microscopy with magnetic field

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