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Nano-Observer AFM

Application fields

  • Material Characterization

  • Polymer Science

  • Electrical Characterization

  • Semiconductor Research

  • Soft Sample Analysis

  • Biological Studies

Nano-Observer I
Versatile and Powerful AFM for Essential Research Needs

The Nano-Observer I is a flexible and powerful Atomic Force Microscope that combines performance, ease of use, and affordability. Designed for both experienced researchers and newcomers to AFM, it offers a wide range of capabilities to meet your essential research needs.

Key Features

Wide Measurement Range:

  • XY Scan Range: 100 μm × 100 μm (±10%)

  • Z Range: 15 μm (±10%)

  • High-resolution imaging with 24-bit control

User-Friendly Design

  • Compact AFM head with pre-positioned tip system

  • Top and side views for easy tip/sample positioning

  • Intuitive software for quick and safe AFM acquisitions

Multiple AFM Modes:

  • Contact/LFM and Oscillating/Phase imaging

  • Advanced modes for mechanical, electrical, and magnetic characterization

HD-KFM Mode:

  • High-definition Kelvin Force Microscopy for surface potential mapping

  • Enhanced sensitivity and resolution compared to standard KFM

HD KFM Graphene (1).png

Graphene Monolayers 20 micron scan

ResiScope:

  • Wide-range resistance measurements from 10² to 10¹² ohms

  • Ideal for conductive, semiconductor and isolant materials

ResiScope 60x60 um battery material conductivity levels

Battery Polymer Material Conductivity Levels - 60x60 µm

AFM Scan Result

Electric Field Microscopy (EFM) is an oscillating mode. A metal tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of the interactions with the gradient of electrical forces present on the surface

AFM Scan Result

Force modulation mode is a mode of contact AFM. A mechanical oscillation is applied to the tip during the scan. A map of mechanical properties is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.

AFM Scan Result

Magnetic Field Microscopy (MFM) is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.

AFM Scan Result

Piezo Force Microscopy (PFM) is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.

AFM Scan Result

Conductive AFM (C-AFM) is an AFM contact mode. A conductive tip saves the current variations of the surface using an amplifier. Curves of current / voltage can be conducted at various locations on the sample.

DISCOVER

MORE

AFM MODES

NOW

Why Choose Nano-Observer I?

Versatility: Wide range of modes and measurements for diverse research needs

User-Friendly: Intuitive software and design for both beginners and experienced users

Performance: Achieve high-resolution imaging and precise measurements

Affordable: Advanced AFM capabilities at a competitive point

Expandable: Compatible with various environmental control options

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